Andika: DCL, Maombi: Automatic Test Equipment, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 84-VFQFN Exposed Pad, CSP, Kifurushi cha Kifaa cha muuzaji: 84-LFCSP-VQ (10x10),
Andika: DCL, Maombi: Automatic Test Equipment, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 84-VFQFN Exposed Pad, CSP, Kifurushi cha Kifaa cha muuzaji: 84-LFCSP-VQ (10x10),
Andika: DCL, Maombi: Automatic Test Equipment, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 84-VFQFN Exposed Pad, CSP, Kifurushi cha Kifaa cha muuzaji: 84-LFCSP-VQ (10x10),
Andika: Per-Pin Parametric Measurement Unit (PPMU), Maombi: Automatic Test Equipment, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 80-TQFP Exposed Pad, Kifurushi cha Kifaa cha muuzaji: 80-TQFP-EP (12x12),
Andika: Per-Pin Parametric Measurement Unit (PPMU), Maombi: Automatic Test Equipment, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 80-TQFP Exposed Pad, Kifurushi cha Kifaa cha muuzaji: 80-TQFP-EP (12x12),
Andika: DCL, Maombi: Automatic Test Equipment, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 100-TQFP Exposed Pad, Kifurushi cha Kifaa cha muuzaji: 100-TQFP-EP (14x14),
Andika: DCL, Maombi: Automatic Test Equipment, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 84-TFBGA, CSPBGA, Kifurushi cha Kifaa cha muuzaji: 84-CSPBGA (9x9),
Andika: DCL, Maombi: Automatic Test Equipment, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 84-TFBGA, CSPBGA, Kifurushi cha Kifaa cha muuzaji: 84-CSPBGA (9x9),
Andika: DCL, Maombi: Automatic Test Equipment, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 100-TQFP Exposed Pad, Kifurushi cha Kifaa cha muuzaji: 100-TQFP-EP (14x14),
Andika: Per-Pin Parametric Measurement Unit (PPMU), Maombi: Automatic Test Equipment, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 80-TQFP Exposed Pad, Kifurushi cha Kifaa cha muuzaji: 80-TQFP-EP (12x12),
Andika: Power Supply, Maombi: Automatic Test Equipment, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 72-TFBGA, CSPBGA, Kifurushi cha Kifaa cha muuzaji: 72-CSPBGA (8x8),
Andika: CCD Signal Processor, 14-Bit, Maombi: Digital Camera, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 100-LFBGA, CSPBGA, Kifurushi cha Kifaa cha muuzaji: 100-CSBGA (9x9),
Andika: Power Supply, Maombi: Automatic Test Equipment, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 64-TQFP Exposed Pad, Kifurushi cha Kifaa cha muuzaji: 64-TQFP-EP (10x10),
Andika: Per-Pin Parametric Measurement Unit (PPMU), Maombi: Automatic Test Equipment, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 64-LQFP, Kifurushi cha Kifaa cha muuzaji: 64-LQFP (10x10),
Andika: Power Supply, Maombi: Automatic Test Equipment, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 72-TFBGA, CSPBGA, Kifurushi cha Kifaa cha muuzaji: 72-CSPBGA (8x8),
Andika: CCD Signal Processor, 14-Bit, Maombi: Digital Camera, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 100-LFBGA, CSPBGA, Kifurushi cha Kifaa cha muuzaji: 100-CSBGA (9x9),
Andika: Power Supply, Maombi: Automatic Test Equipment, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 64-TQFP Exposed Pad, Kifurushi cha Kifaa cha muuzaji: 64-TQFP-EP (10x10),
Andika: Imaging Signal Processor, Maombi: Digital Camera, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 48-LQFP, Kifurushi cha Kifaa cha muuzaji: 48-LQFP (7x7),
Andika: Imaging Signal Processor, Maombi: Digital Camera, Aina ya Kuweka: Surface Mount, Kifurushi / Kesi: 48-LQFP, Kifurushi cha Kifaa cha muuzaji: 48-LQFP (7x7),